Difference between revisions of "Publications"

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**ANL Publications #: 53859, 53004 (abstract)
 
**ANL Publications #: 53859, 53004 (abstract)
 
**Other ID #s: 116561, 115802 (abstract)
 
**Other ID #s: 116561, 115802 (abstract)
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 +
----
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===Microwave dielectric spectroscopy of gases.===
 +
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*'''Type:''' Full Length Conf. Paper
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*'''Date Cleared:''' 06/28/2000
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*'''Authors:''' Elmer, T. W.;Gopalsami, N.
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*'''Conference Sponsor:''' Mid-American Chinese American Professionals Association;FNAL;Motorola Inc.;DePaul Univ.;Lucent Tech.
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*'''Conference:''' 16th International Conference on Advanced Science and Technology 2000 (ICAST 2000)
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*'''Location:''' Batavia, IL
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*'''Conference Date:''' Jun. 3, 2000
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*'''Proceedings Title:''' Proc.
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*'''Proceedings Citation:''' edited by J.-C. Chern,pp. 55-58
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*'''Proceedings Date:''' 2000
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*'''Report No.:''' ANL/ET/CP-102208
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*'''Affiliations'''
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**ANL Divisions: ET
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*'''Keynumbers'''
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**ANL Publications #: 36438
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**Other ID #s: 102208, P45289

Revision as of 23:38, 1 June 2009

Millimeter wave sensor for far-field standoff vibrometry.

  • Type: Full Length Conf. Paper
  • Date Cleared: 09/05/2008, 05/12/2008 (abstract)
  • Authors: Bakhtiari, S.;Gopalsami, N.;Elmer, T. W.;Raptis, A. C.
  • Conference: 35th Annual Review of Progress in Quantitative Nondestructive Evaluation (QNDE 2008)
  • Location: Chicago, IL
  • Conference Date: Jul. 20, 2008 - Jul. 25, 2008
  • Report No.: ANL/NE/CP-62458
  • Affiliations
    • ANL Divisions: NE
  • Keynumbers
    • ANL Publications #: 62458, 61637 (abstract)
    • Associated Project Reference #: 2007-113-R1, 03887-00 (abstract)

Development of flaw sizing algorithms for eddy current rotating probes.

  • Type: Abstract Conf. Paper
  • Date Cleared: 04/22/2008
  • Authors: Bakhtiari, S.;Elmer, T. W.
  • Conference: EPRI 27th Steam Generator NDE Workshop
  • Location: Palm Desert, CA
  • Conference Date: Jul. 21, 2008 - Jul. 23, 2008
  • Affiliations
    • ANL Divisions: NE
  • Keynumbers
    • ANL Publications #: 61543

Application of millimeter-wave radiometry for remote chemical detection.

  • Type: Full Length Journal Article
  • Date Cleared: 08/09/2007
  • Authors: Gopalsami, N.;Bakhtiari, S.;Elmer, T. W.;Raptis, A. C.
  • Submitted To: IEEE Trans. on Microwave Theory Tech.
  • Published In: IEEE Trans. on Microwave Theory Tech.
    • Volume: 56
    • Issue: 3
    • Pages: 700-709
    • Issue Date: Mar. 2008
  • Affiliations
    • ANL Divisions: NE
  • Keynumbers
    • ANL Publications #: 59825

Passive millimeter wave sensor for remote chemical detection.

  • Type: Full Length Public Comm. (Award Entry)
  • Date Cleared: 03/13/2007
  • Authors: Gopalsami, N.;Bakhitari, S.;Raptis, A.;Elmer, T.
  • Submitted To: R&D Magazine (R&D100 Awards)
    • DVD to accompany entry
  • Affiliations
    • ANL Divisions: NE;OTT;TSD
  • Keynumbers
    • ANL Publications #: 58677

A millimeter-wave radiometer for terrestrial remote sensing of chemical plumes.

  • Type: Full Length Conf. Paper
  • Date Cleared: 11/30/2006, 04/12/2007
  • Authors: Bakhtiari, S.;Gopalsami, N.;Elmer, T.;Raptis, A. C.
  • Conference: 3rd International Conference on Electromagnetic Near-Field Characterization and Imaging (ICONIC 2007)
  • Location: St. Louis, MO
  • Conference Date: Jun. 27, 2007 - Jun. 29, 2007
  • Report No.: ANL/NE/CP-57949, ANL/NE/CP-58996
  • Affiliations
    • ANL Divisions: NE
  • Keynumbers
    • ANL Publications #: 57949, 58996

Remote detection of chemicals with passive millimeter waves.

  • Type: Full Length Conf. Paper
  • Date Cleared: 09/25/2006, 04/07/2006 (abstract)
  • Authors: Gopalsami, N.;Bakhtiari, S.;Elmer, T.;Raptis, A. C.
  • Conference Sponsor: DOE
  • Conference: SPIE Conference on Chemical and Biological Sensors for Industrial and Environmental Monitoring
  • Location: Boston, MA
  • Conference Date: Oct. 3, 2006 - Oct. 4, 2006
  • Report No.: ANL/NE/CP-119279
  • Affiliations
    • ANL Divisions: ET
  • Keynumbers
    • ANL Publications #: 57409, 56082 (abstract)
    • Other ID #s: 119279

A computer-aided analysis tool for flaw sizing based on eddy current inspection data.

  • Type: Full Length Other
  • Date Cleared: 07/07/2005, 04/01/2005 (abstract)
  • Authors: Bakhtiari, S.;Kupperman, D. S.;Elmer, T. W.
  • Conference Sponsor: EPRI/NRC
  • Conference: 24th Annual EPRI Steam Generator NDE Workshop
  • Location: San Diego, CA
  • Conference Date: Jul. 11, 2005 - Jul. 13, 2005
  • Affiliations
    • ANL Divisions: ET
  • Keynumbers
    • ANL Publications #: 53859, 53004 (abstract)
    • Other ID #s: 116561, 115802 (abstract)

Microwave dielectric spectroscopy of gases.

  • Type: Full Length Conf. Paper
  • Date Cleared: 06/28/2000
  • Authors: Elmer, T. W.;Gopalsami, N.
  • Conference Sponsor: Mid-American Chinese American Professionals Association;FNAL;Motorola Inc.;DePaul Univ.;Lucent Tech.
  • Conference: 16th International Conference on Advanced Science and Technology 2000 (ICAST 2000)
  • Location: Batavia, IL
  • Conference Date: Jun. 3, 2000
  • Proceedings Title: Proc.
  • Proceedings Citation: edited by J.-C. Chern,pp. 55-58
  • Proceedings Date: 2000
  • Report No.: ANL/ET/CP-102208
  • Affiliations
    • ANL Divisions: ET
  • Keynumbers
    • ANL Publications #: 36438
    • Other ID #s: 102208, P45289