Difference between revisions of "Publications"

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===A computer-aided analysis tool for flaw sizing based on eddy current inspection data.===
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*'''Type:''' Full Length Other
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*'''Date Cleared:''' 07/07/2005
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*'''Authors:''' Bakhtiari, S.;Kupperman, D. S.;Elmer, T. W.
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*'''Conference Sponsor:''' EPRI/NRC
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*'''Conference:''' 24th Annual EPRI Steam Generator NDE Workshop
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*'''Location:''' San Diego, CA
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*'''Conference Date:''' Jul. 11, 2005 - Jul. 13, 2005
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*'''Affiliations'''
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**ANL Divisions: ET
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*'''Keynumbers'''
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**ANL Publications #: 53859
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**Other ID #s: 116561

Revision as of 23:10, 1 June 2009

Millimeter wave sensor for far-field standoff vibrometry.

  • Type: Full Length Conf. Paper
  • Date Cleared: 09/05/2008, 05/12/2008 (abstract)
  • Authors: Bakhtiari, S.;Gopalsami, N.;Elmer, T. W.;Raptis, A. C.
  • Conference: 35th Annual Review of Progress in Quantitative Nondestructive Evaluation (QNDE 2008)
  • Location: Chicago, IL
  • Conference Date: Jul. 20, 2008 - Jul. 25, 2008
  • Report No.: ANL/NE/CP-62458
  • Affiliations
    • ANL Divisions: NE
  • Keynumbers
    • ANL Publications #: 62458, 61637 (abstract)
    • Associated Project Reference #: 2007-113-R1, 03887-00 (abstract)

Development of flaw sizing algorithms for eddy current rotating probes.

  • Type: Abstract Conf. Paper
  • Date Cleared: 04/22/2008
  • Authors: Bakhtiari, S.;Elmer, T. W.
  • Conference: EPRI 27th Steam Generator NDE Workshop
  • Location: Palm Desert, CA
  • Conference Date: Jul. 21, 2008 - Jul. 23, 2008
  • Affiliations
    • ANL Divisions: NE
  • Keynumbers
    • ANL Publications #: 61543

A millimeter-wave radiometer for terrestrial remote sensing of chemical plumes.

  • Type: Full Length Conf. Paper
  • Date Cleared: 11/30/2006, 04/12/2007
  • Authors: Bakhtiari, S.;Gopalsami, N.;Elmer, T.;Raptis, A. C.
  • Conference: 3rd International Conference on Electromagnetic Near-Field Characterization and Imaging (ICONIC 2007)
  • Location: St. Louis, MO
  • Conference Date: Jun. 27, 2007 - Jun. 29, 2007
  • Report No.: ANL/NE/CP-57949, ANL/NE/CP-58996
  • Affiliations
    • ANL Divisions: NE
  • Keynumbers
    • ANL Publications #: 57949, 58996

A computer-aided analysis tool for flaw sizing based on eddy current inspection data.

  • Type: Full Length Other
  • Date Cleared: 07/07/2005
  • Authors: Bakhtiari, S.;Kupperman, D. S.;Elmer, T. W.
  • Conference Sponsor: EPRI/NRC
  • Conference: 24th Annual EPRI Steam Generator NDE Workshop
  • Location: San Diego, CA
  • Conference Date: Jul. 11, 2005 - Jul. 13, 2005
  • Affiliations
    • ANL Divisions: ET
  • Keynumbers
    • ANL Publications #: 53859
    • Other ID #s: 116561