Publications

Millimeter wave sensor for far-field standoff vibrometry.

• Type: Full Length Conf. Paper
• Date Cleared: 09/05/2008, 05/12/2008 (abstract)
• Authors: Bakhtiari, S.;Gopalsami, N.;Elmer, T. W.;Raptis, A. C.
• Conference: 35th Annual Review of Progress in Quantitative Nondestructive Evaluation (QNDE 2008)
• Location: Chicago, IL
• Conference Date: Jul. 20, 2008 - Jul. 25, 2008
• Report No.: ANL/NE/CP-62458
• Affiliations
  • ANL Divisions: NE
• Keynumbers
  • ANL Publications #: 62458, 61637 (abstract)
  • Associated Project Reference #: 2007-113-R1, 03887-00 (abstract)

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Development of flaw sizing algorithms for eddy current rotating probes.

• Type: Abstract Conf. Paper
• Date Cleared: 04/22/2008
• Authors: Bakhtiari, S.;Elmer, T. W.
• Conference: EPRI 27th Steam Generator NDE Workshop
• Location: Palm Desert, CA
• Conference Date: Jul. 21, 2008 - Jul. 23, 2008
• Affiliations
  • ANL Divisions: NE
• Keynumbers
  • ANL Publications #: 61543

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Application of millimeter-wave radiometry for remote chemical detection.

• Type: Full Length Journal Article
• Date Cleared: 08/09/2007
• Authors: Gopalsami, N.;Bakhtiari, S.;Elmer, T. W.;Raptis, A. C.
• Submitted To: IEEE Trans. on Microwave Theory Tech.
• Published In: IEEE Trans. on Microwave Theory Tech.
  • Volume: 56
  • Issue: 3
  • Pages: 700-709
  • Issue Date: Mar. 2008
• Affiliations
  • ANL Divisions: NE
• Keynumbers
  • ANL Publications #: 59825

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A millimeter-wave radiometer for terrestrial remote sensing of chemical plumes.

• Type: Full Length Conf. Paper
• Date Cleared: 11/30/2006, 04/12/2007
• Authors: Bakhtiari, S.;Gopalsami, N.;Elmer, T.;Raptis, A. C.
• Conference: 3rd International Conference on Electromagnetic Near-Field Characterization and Imaging (ICONIC 2007)
• Location: St. Louis, MO
• Conference Date: Jun. 27, 2007 - Jun. 29, 2007
• Report No.: ANL/NE/CP-57949, ANL/NE/CP-58996
• Affiliations
  • ANL Divisions: NE
• Keynumbers
  • ANL Publications #: 57949, 58996

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Remote detection of chemicals with passive millimeter waves.

• Type: Full Length Conf. Paper
• Date Cleared: 09/25/2006, 04/07/2006 (abstract)
• Authors: Gopalsami, N.;Bakhtiari, S.;Elmer, T.;Raptis, A. C.
• Conference Sponsor: DOE
• Conference: SPIE Conference on Chemical and Biological Sensors for Industrial and Environmental Monitoring
• Location: Boston, MA
• Conference Date: Oct. 3, 2006 - Oct. 4, 2006
• Report No.: ANL/NE/CP-119279
• Affiliations
  • ANL Divisions: ET
• Keynumbers
  • ANL Publications #: 57409, 56082 (abstract)
  • Other ID #s: 119279

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A computer-aided analysis tool for flaw sizing based on eddy current inspection data.

• Type: Full Length Other
• Date Cleared: 07/07/2005, 04/01/2005 (abstract)
• Authors: Bakhtiari, S.;Kupperman, D. S.;Elmer, T. W.
• Conference Sponsor: EPRI/NRC
• Conference: 24th Annual EPRI Steam Generator NDE Workshop
• Location: San Diego, CA
• Conference Date: Jul. 11, 2005 - Jul. 13, 2005
• Affiliations
  • ANL Divisions: ET
• Keynumbers
  • ANL Publications #: 53859, 53004 (abstract)
  • Other ID #s: 116561, 115802 (abstract)