Difference between revisions of "Publications"

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(→‎Papers: Data Analysis Algorithms for Flaw Sizing Based on Eddy Current Rotating Probe Examination of Steam Generator Tubes.)
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**"[http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=4682631&isnumber=4696624&type=ref Microwave Photonic Noise Source From Microwave to Sub-Terahertz Wave Bands and Its Applications to Noise Characterization]". Ho-Jin Song; Shimizu, N; Kukutsu, N; Nagatsuma, T; Kado, Y.  ''IEEE Transactions on Microwave Theory and Techniques''.  Volume: 56,  Issue: 12, Part 1.  Pp 2989-2997.
 
**"[http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=4682631&isnumber=4696624&type=ref Microwave Photonic Noise Source From Microwave to Sub-Terahertz Wave Bands and Its Applications to Noise Characterization]". Ho-Jin Song; Shimizu, N; Kukutsu, N; Nagatsuma, T; Kado, Y.  ''IEEE Transactions on Microwave Theory and Techniques''.  Volume: 56,  Issue: 12, Part 1.  Pp 2989-2997.
 
**"[http://www.google.com/url?sa=t&source=web&ct=res&cd=1&url=http%3A%2F%2Fursi-test.intec.ugent.be%2Ffiles%2FURSIGA08%2Fpapers%2FD07p3.pdf&ei=S8NGSpCsI4nQM5_kwZYB&usg=AFQjCNHPO87J9yBiXH0DTG7lm-1tuUAB8g Novel Terahertz Sources and Applications to Security]". S. G. Biedron, et al.
 
**"[http://www.google.com/url?sa=t&source=web&ct=res&cd=1&url=http%3A%2F%2Fursi-test.intec.ugent.be%2Ffiles%2FURSIGA08%2Fpapers%2FD07p3.pdf&ei=S8NGSpCsI4nQM5_kwZYB&usg=AFQjCNHPO87J9yBiXH0DTG7lm-1tuUAB8g Novel Terahertz Sources and Applications to Security]". S. G. Biedron, et al.
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**"[http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=05233756 Passive Millimeter-Wave Microscopy]". Nozokido, T.; Noto, M.; Murai, T. ''Microwave and Wireless Components Letters, IEEE''. Volume: 19,  Issue: 10. Pp 638-640
 
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Revision as of 22:45, 2 December 2009

The following is a list of publications by Thomas W Elmer II, in reverse order by date.

Papers

Data Analysis Algorithms for Flaw Sizing Based on Eddy Current Rotating Probe Examination of Steam Generator Tubes.

  • Type: Full Length Conf. Paper
  • Date Cleared: 10/14/2009, 06/18/2009 (abstract)
  • Authors: Bakhtiari, S.;Elmer, T. W.
  • Conference: 6th Canadian Nuclear Society International Steam Generator Conference (program)
  • Location: Toronto, Ontario, Canada
  • Conference Date: Nov. 8, 2009 - Nov. 11, 2009
    • Presented: Paper 5.13, Wed, Nov 11, 15:05
  • Report No.: ANL/NE/CP-65290
  • Affiliations
    • ANL Divisions: NE
  • Keynumbers
    • ANL Publications #: 65290, 64504 (abstract)
  • Download:

Millimeter wave sensor for far-field standoff vibrometry.

  • Type: Full Length Conf. Paper
  • Date Cleared: 09/05/2008, 05/12/2008 (abstract)
  • Authors: Bakhtiari, S.;Gopalsami, N.;Elmer, T. W.;Raptis, A. C.
  • Conference: 35th Annual Review of Progress in Quantitative Nondestructive Evaluation (QNDE 2008)
  • Location: Chicago, IL
  • Conference Date: Jul. 20, 2008 - Jul. 25, 2008
  • Report No.: ANL/NE/CP-62458
  • Affiliations
    • ANL Divisions: NE
  • Keynumbers
    • ANL Publications #: 62458, 61637 (abstract)
    • Associated Project Reference #: 2007-113-R1, 03887-00 (abstract)
  • Download:

Surface Plasmon THz Resonators for Security Applications

Development of flaw sizing algorithms for eddy current rotating probes.

  • Type: Abstract Conf. Paper
  • Date Cleared: 04/22/2008
  • Authors: Bakhtiari, S.;Elmer, T. W.
  • Conference: EPRI 27th Steam Generator NDE Workshop
  • Location: Palm Desert, CA
  • Conference Date: Jul. 21, 2008 - Jul. 23, 2008
  • Affiliations
    • ANL Divisions: NE
  • Keynumbers
    • ANL Publications #: 61543

Application of millimeter-wave radiometry for remote chemical detection.

  • Type: Full Length Journal Article
  • Date Cleared: 08/09/2007
  • Authors: Gopalsami, N.;Bakhtiari, S.;Elmer, T. W.;Raptis, A. C.
  • Submitted To: IEEE Trans. on Microwave Theory Tech.
  • Published In: IEEE Trans. on Microwave Theory Tech.
    • Volume: 56
    • Issue: 3
    • Pages: 700-709
    • Issue Date: Mar. 2008
  • Affiliations
    • ANL Divisions: NE
  • Keynumbers
    • ANL Publications #: 59825
  • Download:
    • ©2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
    • The following article appeared in IEEE Transactions on Microwave Theory and Techniques, vol 56, Number 3, pp 700-709 and may be found at http://ieeexplore.ieee.org.
    • download article
  • Citations:

Passive millimeter wave sensor for remote chemical detection.

  • Type: Full Length Public Comm. (Award Entry)
  • Date Cleared: 03/13/2007
  • Authors: Gopalsami, N.;Bakhitari, S.;Raptis, A.;Elmer, T.
  • Submitted To: R&D Magazine (R&D100 Awards)
    • DVD to accompany entry
  • Affiliations
    • ANL Divisions: NE;OTT;TSD
  • Keynumbers
    • ANL Publications #: 58677

A millimeter-wave radiometer for terrestrial remote sensing of chemical plumes.

  • Type: Full Length Conf. Paper
  • Date Cleared: 11/30/2006, 04/12/2007
  • Authors: Bakhtiari, S.;Gopalsami, N.;Elmer, T.;Raptis, A. C.
  • Conference: 3rd International Conference on Electromagnetic Near-Field Characterization and Imaging (ICONIC 2007)
  • Location: St. Louis, MO
  • Conference Date: Jun. 27, 2007 - Jun. 29, 2007
  • Report No.: ANL/NE/CP-57949, ANL/NE/CP-58996
  • Affiliations
    • ANL Divisions: NE
  • Keynumbers
    • ANL Publications #: 57949, 58996
  • Misc: Used as the source for the magazine article #Covert Plant Detection

Remote detection of chemicals with passive millimeter waves.

  • Type: Full Length Conf. Paper
  • Date Cleared: 09/25/2006, 04/07/2006 (abstract)
  • Authors: Gopalsami, N.;Bakhtiari, S.;Elmer, T.;Raptis, A. C.
  • Conference Sponsor: DOE
  • Conference: SPIE Conference on Chemical and Biological Sensors for Industrial and Environmental Monitoring
  • Location: Boston, MA
  • Conference Date: Oct. 3, 2006 - Oct. 4, 2006
  • Report No.: ANL/NE/CP-119279
  • Affiliations
    • ANL Divisions: ET
  • Keynumbers
    • ANL Publications #: 57409, 56082 (abstract)
    • Other ID #s: 119279

A computer-aided analysis tool for flaw sizing based on eddy current inspection data.

  • Type: Full Length Other
  • Date Cleared: 07/07/2005, 04/01/2005 (abstract)
  • Authors: Bakhtiari, S.;Kupperman, D. S.;Elmer, T. W.
  • Conference Sponsor: EPRI/NRC
  • Conference: 24th Annual EPRI Steam Generator NDE Workshop
  • Location: San Diego, CA
  • Conference Date: Jul. 11, 2005 - Jul. 13, 2005
  • Affiliations
    • ANL Divisions: ET
  • Keynumbers
    • ANL Publications #: 53859, 53004 (abstract)
    • Other ID #s: 116561, 115802 (abstract)

Microwave dielectric spectroscopy of gases.

  • Type: Full Length Conf. Paper
  • Date Cleared: 06/28/2000
  • Authors: Elmer, T. W.;Gopalsami, N.
  • Conference Sponsor: Mid-American Chinese American Professionals Association;FNAL;Motorola Inc.;DePaul Univ.;Lucent Tech.
  • Conference: 16th International Conference on Advanced Science and Technology 2000 (ICAST 2000)
  • Location: Batavia, IL
  • Conference Date: Jun. 3, 2000
  • Proceedings Title: Proc.
  • Proceedings Citation: edited by J.-C. Chern,pp. 55-58
  • Proceedings Date: 2000
  • Report No.: ANL/ET/CP-102208
  • Affiliations
    • ANL Divisions: ET
  • Keynumbers
    • ANL Publications #: 36438
    • Other ID #s: 102208, P45289
  • Citations:

Analysis of Cerrobend Activation Produced by a 250-MeV Medical Proton Accelerator

Other

Covert Plant Detection

Article in Nuclear Engineering International

Millimeter-wave radar sensing of airborne chemicals.

  • Type: Full Length Journal Article
  • Date Cleared: 07/30/2099 < Back | Return to List | Next >
  • Authors: Gopalsami, N.;Raptis, A. C.
    • (T Elmer III [sic] is listed in the Acknowledgment section, since I created the plots for the paper.)
  • Submitted To: IEEE Trans. Microwave Theory Tech.
  • Published In: IEEE Trans. Microwave Theory Tech.
    • Volume: 49
    • Issue: 4
    • Pages: 646-53
    • Issue Date: Apr. 2001
    • DOI: 10.1109/22.915438
  • Affiliations
    • ANL Divisions: ET
  • Keynumbers
    • ANL Publications #: 33492
    • Other ID #s: 099679, P45245

Citations


To Do

Need to add:

  • Other media section? (i.e. newspaper article?)
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