Difference between revisions of "Publications"
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**ANL Publications #: 53859, 53004 (abstract) | **ANL Publications #: 53859, 53004 (abstract) | ||
**Other ID #s: 116561, 115802 (abstract) | **Other ID #s: 116561, 115802 (abstract) | ||
| + | |||
| + | ---- | ||
| + | |||
| + | ===Microwave dielectric spectroscopy of gases.=== | ||
| + | |||
| + | *'''Type:''' Full Length Conf. Paper | ||
| + | *'''Date Cleared:''' 06/28/2000 | ||
| + | *'''Authors:''' Elmer, T. W.;Gopalsami, N. | ||
| + | *'''Conference Sponsor:''' Mid-American Chinese American Professionals Association;FNAL;Motorola Inc.;DePaul Univ.;Lucent Tech. | ||
| + | *'''Conference:''' 16th International Conference on Advanced Science and Technology 2000 (ICAST 2000) | ||
| + | *'''Location:''' Batavia, IL | ||
| + | *'''Conference Date:''' Jun. 3, 2000 | ||
| + | *'''Proceedings Title:''' Proc. | ||
| + | *'''Proceedings Citation:''' edited by J.-C. Chern,pp. 55-58 | ||
| + | *'''Proceedings Date:''' 2000 | ||
| + | *'''Report No.:''' ANL/ET/CP-102208 | ||
| + | *'''Affiliations''' | ||
| + | **ANL Divisions: ET | ||
| + | *'''Keynumbers''' | ||
| + | **ANL Publications #: 36438 | ||
| + | **Other ID #s: 102208, P45289 | ||
Revision as of 23:38, 1 June 2009
Contents
- 1 Millimeter wave sensor for far-field standoff vibrometry.
- 2 Development of flaw sizing algorithms for eddy current rotating probes.
- 3 Application of millimeter-wave radiometry for remote chemical detection.
- 4 A millimeter-wave radiometer for terrestrial remote sensing of chemical plumes.
- 5 Remote detection of chemicals with passive millimeter waves.
- 6 A computer-aided analysis tool for flaw sizing based on eddy current inspection data.
- 7 Microwave dielectric spectroscopy of gases.
Millimeter wave sensor for far-field standoff vibrometry.
- Type: Full Length Conf. Paper
- Date Cleared: 09/05/2008, 05/12/2008 (abstract)
- Authors: Bakhtiari, S.;Gopalsami, N.;Elmer, T. W.;Raptis, A. C.
- Conference: 35th Annual Review of Progress in Quantitative Nondestructive Evaluation (QNDE 2008)
- Location: Chicago, IL
- Conference Date: Jul. 20, 2008 - Jul. 25, 2008
- Report No.: ANL/NE/CP-62458
- Affiliations
- ANL Divisions: NE
- Keynumbers
- ANL Publications #: 62458, 61637 (abstract)
- Associated Project Reference #: 2007-113-R1, 03887-00 (abstract)
Development of flaw sizing algorithms for eddy current rotating probes.
- Type: Abstract Conf. Paper
- Date Cleared: 04/22/2008
- Authors: Bakhtiari, S.;Elmer, T. W.
- Conference: EPRI 27th Steam Generator NDE Workshop
- Location: Palm Desert, CA
- Conference Date: Jul. 21, 2008 - Jul. 23, 2008
- Affiliations
- ANL Divisions: NE
- Keynumbers
- ANL Publications #: 61543
Application of millimeter-wave radiometry for remote chemical detection.
- Type: Full Length Journal Article
- Date Cleared: 08/09/2007
- Authors: Gopalsami, N.;Bakhtiari, S.;Elmer, T. W.;Raptis, A. C.
- Submitted To: IEEE Trans. on Microwave Theory Tech.
- Published In: IEEE Trans. on Microwave Theory Tech.
- Volume: 56
- Issue: 3
- Pages: 700-709
- Issue Date: Mar. 2008
- Affiliations
- ANL Divisions: NE
- Keynumbers
- ANL Publications #: 59825
Passive millimeter wave sensor for remote chemical detection.
- Type: Full Length Public Comm. (Award Entry)
- Date Cleared: 03/13/2007
- Authors: Gopalsami, N.;Bakhitari, S.;Raptis, A.;Elmer, T.
- Submitted To: R&D Magazine (R&D100 Awards)
- DVD to accompany entry
- Affiliations
- ANL Divisions: NE;OTT;TSD
- Keynumbers
- ANL Publications #: 58677
A millimeter-wave radiometer for terrestrial remote sensing of chemical plumes.
- Type: Full Length Conf. Paper
- Date Cleared: 11/30/2006, 04/12/2007
- Authors: Bakhtiari, S.;Gopalsami, N.;Elmer, T.;Raptis, A. C.
- Conference: 3rd International Conference on Electromagnetic Near-Field Characterization and Imaging (ICONIC 2007)
- Location: St. Louis, MO
- Conference Date: Jun. 27, 2007 - Jun. 29, 2007
- Report No.: ANL/NE/CP-57949, ANL/NE/CP-58996
- Affiliations
- ANL Divisions: NE
- Keynumbers
- ANL Publications #: 57949, 58996
Remote detection of chemicals with passive millimeter waves.
- Type: Full Length Conf. Paper
- Date Cleared: 09/25/2006, 04/07/2006 (abstract)
- Authors: Gopalsami, N.;Bakhtiari, S.;Elmer, T.;Raptis, A. C.
- Conference Sponsor: DOE
- Conference: SPIE Conference on Chemical and Biological Sensors for Industrial and Environmental Monitoring
- Location: Boston, MA
- Conference Date: Oct. 3, 2006 - Oct. 4, 2006
- Report No.: ANL/NE/CP-119279
- Affiliations
- ANL Divisions: ET
- Keynumbers
- ANL Publications #: 57409, 56082 (abstract)
- Other ID #s: 119279
A computer-aided analysis tool for flaw sizing based on eddy current inspection data.
- Type: Full Length Other
- Date Cleared: 07/07/2005, 04/01/2005 (abstract)
- Authors: Bakhtiari, S.;Kupperman, D. S.;Elmer, T. W.
- Conference Sponsor: EPRI/NRC
- Conference: 24th Annual EPRI Steam Generator NDE Workshop
- Location: San Diego, CA
- Conference Date: Jul. 11, 2005 - Jul. 13, 2005
- Affiliations
- ANL Divisions: ET
- Keynumbers
- ANL Publications #: 53859, 53004 (abstract)
- Other ID #s: 116561, 115802 (abstract)
Microwave dielectric spectroscopy of gases.
- Type: Full Length Conf. Paper
- Date Cleared: 06/28/2000
- Authors: Elmer, T. W.;Gopalsami, N.
- Conference Sponsor: Mid-American Chinese American Professionals Association;FNAL;Motorola Inc.;DePaul Univ.;Lucent Tech.
- Conference: 16th International Conference on Advanced Science and Technology 2000 (ICAST 2000)
- Location: Batavia, IL
- Conference Date: Jun. 3, 2000
- Proceedings Title: Proc.
- Proceedings Citation: edited by J.-C. Chern,pp. 55-58
- Proceedings Date: 2000
- Report No.: ANL/ET/CP-102208
- Affiliations
- ANL Divisions: ET
- Keynumbers
- ANL Publications #: 36438
- Other ID #s: 102208, P45289
